News
TCXO Digital Compensation Algorithm Iteration Further Reduces Full-Temperature Frequency Drift
2026-06-11
Conventional digital TCXO widely adopts fixed segmented linear interpolation compensation algorithm, dividing full operating temperature range from -40℃ to +85℃ into dozens of equal temperature segments with one set of fixed compensation coefficients stored for each segment. Linear correction formulas are directly applied to calculate frequency offset compensation values for temperature changes within each segment. Featuring simple logic and low computing load for on-chip MCU, this scheme still leaves obvious residual compensation deviation at high and low temperature endpoints with sharp curve curvature, as actual temperature drift curves of quartz crystals are non-linear, limiting upper precision limit of TCXO.
Two updated optimized algorithms are proposed: high-order polynomial fitting compensation and multi-point adaptive dense sampling compensation. High-order polynomial fitting abandons piecewise linear approximation and reproduces measured crystal temperature drift curves completely with high-order mathematical curves, realizing continuous frequency offset correction with only one group of fitting coefficients for the whole temperature range and eliminating compensation jump errors at segment junctions. The adaptive dense sampling algorithm automatically splits more sub-segments at low and high temperature endpoints with steep drift curvature and keeps sparse segmentation at room temperature zones with gentle curvature, specifically cutting residual drift at error-concentrated zones without obvious rise of MCU computing load.
Both optimized algorithms realize precision upgrade merely through firmware upgrade without modifying original TCXO hardware chips and sensors, requiring no PCB package redesign or peripheral circuit revision. Measured data proves that maximum full-temperature frequency drift decreases remarkably after algorithm iteration with identical hardware configuration, enabling mid-range TCXO to meet timing demands of some precision testing equipment previously only accessible to high-end TCXO. It expands performance coverage of digitally temperature compensated crystals and balances hardware iteration cost and precision improvement gains.
2026-06-10
-
Our R&D team mainly consists of doctors and masters from the University of Electronic Science and Technology of China (UESTC) and Xidian University (XDU), with extensive practical and academic experience in the industry. The management team has more than 10 years of experience in industrial production and quality management.
Contact Us
-
> Service Hotline: +86 400-613-9133
> Tel: +86 18926758761
> Email: Amy@junteli.com
> Address: Room 207, Building C, Chuangzhao Industrial Park, Kengzi Subdistrict, Pingshan District, Shenzhen City
copyright © 2026 Junteli Technology Group .Ltd.